Research & Scholarly Activity

Research & Scholarly Activity

  • Adhesion and bonding mechanisms
    2005-3000

    Description: null

  • Advanced Stent Development, Advanced Cardiovascula
    2005-3000

    Description: Advanced Stent Development, Advanced Cardiovascular Systems, Inc.

  • Alternate Lead Free Alloys, Sjsu Foundation
    2005-3000

    Description: Alternate Lead Free Alloys, SJSU Foundation

  • Characterization Of Glass Substrates For Hard Driv
    2005-3000

    Description: Characterization of Glass Substrates for Hard Drive Applications, Seagate Technology

  • Collaborative For Disaster Mitigation Implementati
    2005-3000

    Description: Collaborative for Disaster Mitigation Implementation Grant, Federal Emergency Management Agency

  • College Of Engineering Recognition Award, Sjsu Col
    2005-3000

    Description: College of Engineering Recognition Award, SJSU College of Engineering

  • Computer Modeling Of Solder Joint Fatigue Life For
    2005-3000

    Description: Computer Modeling of Solder Joint Fatigue Life for μSMD Structures, National Semiconductor Corporation

  • Corrosion Evaluation Of Heat Exchanger Tubing, Pac
    2005-3000

    Description: Corrosion Evaluation of Heat Exchanger Tubing, Pacific Gas & Electric Company

  • Corrosion Testing Of Condenser Tube Materials At G
    2005-3000

    Description: Corrosion Testing of Condenser Tube Materials at Geysers Power Plant, Pacific Gas & Electric Company

  • Corrosion phenomen
    2005-3000

    Description: null

  • Design And Prototype Construction Of Sorting Table
    2005-3000

    Description: Design and Prototype Construction of Sorting Table, Franchise Tax Board, California

  • Development Of Business Continuity Plan, Sjsu Foun
    2005-3000

    Description: Development of Business Continuity Plan, SJSU Foundation

  • Development Of Cost/Benefit Analysis Methodologies
    2005-3000

    Description: Development of Cost/Benefit Analysis Methodologies for Hazard Mitigation Projects, Federal Emergency Management Agency

  • Development Of Guide Wires For Angioplasty, Advanc
    2005-3000

    Description: Development of Guide Wires for Angioplasty, Advanced Cardio-vascular Systems, Inc.

  • Development Of Processing Techniques For Advanced
    2005-3000

    Description: Development of Processing Techniques for Advanced Thermal Protection Materials, NASA-Ames Research Center, Thermal Protection Materials Branch

  • Disaster Resistant California Conference, Fema
    2005-3000

    Description: Disaster Resistant California Conference, FEMA

  • Earthquake Caused Hazardous Materials Incidents, U
    2005-3000

    Description: Earthquake Caused Hazardous Materials Incidents, U.S. Department of Interior, U.S. Geological Survey

  • Earthquake Hazard Mitigation, California Office Of
    2005-3000

    Description: Earthquake Hazard Mitigation, California Office of Emergency Services

  • Earthquake hazard mitigation
    2005-3000

    Description: null

  • Effect Of Geometry On Solder Joint Reliability For
    2005-3000

    Description: Effect of Geometry on Solder Joint Reliability for Leadless Leadframe Packages, National Semiconductor Corporation

  • Effect Of Processing Parameters On Strength Of Sil
    2005-3000

    Description: Effect of Processing Parameters on Strength of Silicon Dies, LSI Logic, Inc.

  • Effect Of Thermal Processing On Microstructure Of
    2005-3000

    Description: Effect of Thermal Processing on Microstructure of Ball Grid Arrays, Solectron Corporation

  • Evaluation Of Sterilization Techniques, Guidant Co
    2005-3000

    Description: Evaluation of Sterilization Techniques, Guidant Corporation

  • Extraction Table Design And Prototype Development,
    2005-3000

    Description: Extraction Table Design and Prototype Development, Franchise Tax Board

  • Field Emission Breakdown Of High-Voltage Insulatio
    2005-3000

    Description: Field Emission Breakdown of High-Voltage Insulation Devices, Communications & Power Industries, Inc.,

  • Fluxless Soldering For Microelectronic Packages, S
    2005-3000

    Description: Fluxless Soldering for Microelectronic Packages, Solectron Corporation

  • Fracture and failure analysis
    2005-3000

    Description: null

  • Hazard Mitigation Implementation For Small Busines
    2005-3000

    Description: Hazard Mitigation Implementation for Small Businesses, FEMA

  • Hazardous Materials Incidents During Earthquakes:
    2005-3000

    Description: Hazardous Materials Incidents During Earthquakes: Japan's Experience and Solutions, National Science Foundation

  • Homeowners Guide To Seismic Safety, California Sei
    2005-3000

    Description: Homeowners Guide to Seismic Safety, California Seismic Safety Commission

  • Inventory Of Soft First Story Multi-Family Dwellin
    2005-3000

    Description: Inventory of Soft First Story Multi-Family Dwellings in Santa Clara County, Santa Clara County, Emergency Preparedness Council

  • Investigation Of Solder Mask Cracking, Lsi Logic
    2005-3000

    Description: Investigation of Solder Mask Cracking, LSI Logic

  • Magnetic Recording Head Contamination Research, Ak
    2005-3000

    Description: Magnetic Recording Head Contamination Research, Akashic Memories Corporation

  • Nonstructural Earthquake Hazard Mitigation, Califo
    2005-3000

    Description: Nonstructural Earthquake Hazard Mitigation, California Emergency Medical Services Agency

  • Nonstructural Earthquake Hazard Mitigation, Emerge
    2005-3000

    Description: Nonstructural Earthquake Hazard Mitigation, Emergency Medical Services Agency, California

  • Nsf Instrumentation And Laboratory Improvement Pro
    2005-3000

    Description: NSF Instrumentation and Laboratory Improvement Program in Microprocessor and Intelligent Control Applications (Co-Principal Investigator), National Science Foundation

  • Packaging Of Microelectronic Devices: Short Cours
    2005-3000

    Description: Packaging of Microelectronic Devices: Short Courses for Undergraduate Faculty Enhancement, National Science Foundation

  • Radio Frequency Vapor Deposition Of Diboride Compo
    2005-3000

    Description: Radio Frequency Vapor Deposition of Diboride Compounds on Ceramic Fibers, NASA-Ames, Thermal Protection Materials Branch

  • Recyclability Of Multi-Material Durable Goods, Ci
    2005-3000

    Description: Recyclability of Multi-Material Durable Goods, City of San Jose

  • Recycled Glass: Development Of Market Potential,
    2005-3000

    Description: Recycled Glass: Development of Market Potential, City of San Jose

  • Recycled Glass: Process Development For Sintered
    2005-3000

    Description: Recycled Glass: Process Development for Sintered Glass Architectural Tiles, City of San Jose

  • Screen Printing Of Wafer Level Underfill, National
    2005-3000

    Description: Screen Printing of Wafer Level Underfill, National Semiconductor Corporation

  • Signal Speed Comparison Of Flip-Chip And Wire-Bond
    2005-3000

    Description: Signal Speed Comparison of Flip-Chip and Wire-Bonded Multichip Modules, Lockheed Corporation

  • Sol-Gel Synthesis Of Borosilicate Glass, Ishm Educ
    2005-3000

    Description: Sol-gel Synthesis of Borosilicate Glass, ISHM Educational Foundation

  • Surface science and engineering
    2005-3000

    Description: null

  • Thermal Conductivity Of Interlaced Two Phase Syste
    2005-3000

    Description: Thermal Conductivity of Interlaced Two Phase Systems for Fusible Heat Sink Applications, NASA-Ames, Life Sciences Division

  • Tingle Table Ii Construction, Franchise Tax Board
    2005-3000

    Description: Tingle Table II Construction, Franchise Tax Board

  • Tingle Table Ii Construction, Franchise Tax Board
    2005-3000

    Description: Tingle Table II Construction, Franchise Tax Board

  • Utilization of Pb-free solders in microdevices
    2005-3000

    Description: null

  • Utilizing Relational Databases For Materials Prope
    2005-3000

    Description: Utilizing Relational Databases for Materials Properties, WhoWhere, Inc.

  • Wire Bond Integrity For Fine Pitch Devices, Nation
    2005-3000

    Description: Wire Bond Integrity for Fine Pitch Devices, National Semiconductor Corporation